electron scattering by defects

electron scattering by defects
Макаров: рассеяние электронов на дефектах

Универсальный англо-русский словарь. . 2011.

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  • Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… …   Wikipedia

  • Electron mobility — This article is about the mobility for electrons and holes in metals and semiconductors. For the general concept, see Electrical mobility. In solid state physics, the electron mobility characterizes how quickly an electron can move through a… …   Wikipedia

  • Scattering — is a general physical process where some forms of radiation, such as light, sound, or moving particles, are forced to deviate from a straight trajectory by one or more localized non uniformities in the medium through which they pass. In… …   Wikipedia

  • Helium atom scattering — (HAS) is a surface analysis technique used in materials science. HAS provides information about the surface structure and lattice dynamics of a material by measuring the diffracted atoms from a monochromatic helium beam incident on the sample.… …   Wikipedia

  • Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors …   Wikipedia

  • High-resolution transmission electron microscopy — (HRTEM) is an imaging mode of the transmission electron microscope (TEM) that allows the imaging of the crystallographic structure of a sample at an atomic scale. [cite book |title=Experimental high resolution electron microscopy |last=Spence… …   Wikipedia

  • Carrier scattering — Defect types include atom vacancies, adatoms, steps, and kinks which occur most frequently at surfaces due to finite material size causing crystal discontinuity. What all types of defects have in common, whether they be surface or bulk, is that… …   Wikipedia

  • Transmission electron microscopy — A TEM image of the polio virus. The polio virus is 30 nm in size.[1] Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it… …   Wikipedia

  • Crystallographic defects in diamond — Synthetic diamonds of various colors grown by the high pressure high temperature technique, the diamond size is 2 mm …   Wikipedia

  • Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

  • Umklapp scattering — [ Figure 2.: k vectors exceeding the first Brillouin zone (red) do not carry more information than their counterparts (black) in the first Brillouin zone.] Umklapp scattering (also U process or Umklapp process) is an anharmonic phonon phonon (or… …   Wikipedia


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